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Автор: Pierre Jaegle
Издательство: Springer
Год издания: 2006
isbn: 0387230076
Количество страниц: 409
Язык: english
Формат: PDF
Размер: 6 Мб
Каталожный номер: 46974
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The radiation range of photon energy comprised between, let us say, 20 eV and 600 eV is known by the names of extreme ultraviolet, soft X-ray or XUV radiation. This fluctuating designation reflects the various origins of a radiation pattern which, in other respects, exhibits singular optical properties marking it off from far-ultraviolet, on one side, and X-rays, on the other. The penetration length of XUV radiation is very small in almost all materials—generally less than 1 ?m. There is practically no reflection on optical surfaces under normal incidence and, in addition, wavelength is too large to make use of Bragg reflection on natural crystals. These peculiarities made the development of instrumentation for XUV studies more difficult than for others spectral fields, a fact which has been prejudicial to the advance of XUV research. During the last decades important progress, especially in XUV optics, became possible with the help of synchrotron radiation sources.
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